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Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models

This story is from 2026-11-02. It is preserved in the archive; the latest stories are on the live feed.

arXiv:2610.41199v1 Announce Type: new Abstract: Cameras and vision sensors are widely used for product and process inspection in manufacturing environments. Traditionally, this process required thousands of images of both nominal and defective products to train such models. Recent research shows th…

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Timeline · 2 reports

  1. 2026-11-02 05:00 · arXiv cs.CL
    EDU-Jev Training System-One Decision Models for Education
  2. 2026-11-02 05:00 · arXiv cs.CV
    Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models

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