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Two New Papers Propose 'One Decision' Model Framework for Education and Defect Detection

Two new arXiv papers introduce 'System One Decision' models: one applies the approach to automated education decisions like rubric scoring, the other to calibrated few-shot defect detection in manufacturing inspection.

Read the full story at arXiv cs.CL ↗

Timeline · 2 reports

  1. 2026-11-02 05:00 · arXiv cs.CV
    Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models
  2. 2026-11-02 05:00 · arXiv cs.CL
    EDU-Jev Training System-One Decision Models for Education

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